使用xds100v3仿真AM5728遇到的问题

随风吟

在使用CCS7.0版本按照文档仿真测试时，将开发板switch置为11111，上电，点击test connection时
出现错误：
[Start: Texas Instruments XDS100v3 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\fscut1\AppData\Local\TEXASI~1\CCS\
    ti\4\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusbv3.dll'.
The library build date was 'Dec  9 2016'.
The library build time was '13:48:53'.
The library package version is '6.0.504.1'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

  Test  Size   Coord      MHz    Flag  Result       Description
  ~~~~  ~~~~  ~~~~~~~  ~~~~~~~~  ~~~~  ~~~~~~~~~~~  ~~~~~~~~~~~~~~~~~~~
    1     64  - 01 00  500.0kHz   O    good value   measure path length
    2     64  + 00 00  1.000MHz  [O]   good value   apply explicit tclk

There is no hardware for measuring the JTAG TCLK frequency.

In the scan-path tests:
The test length was 2048 bits.
The JTAG IR length was 6 bits.
The JTAG DR length was 1 bits.

The IR/DR scan-path tests used 2 frequencies.
The IR/DR scan-path tests used 500.0kHz as the initial frequency.
The IR/DR scan-path tests used 1.000MHz as the highest frequency.
The IR/DR scan-path tests used 1.000MHz as the final frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 32 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x0000003F.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x80F83880.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x80F838BF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted - 67.2 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFC07C1C5.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 66.7 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v3 USB Debug Probe_0]


后面忽略这个错误，直接进行后面连接 ARM CortexA15_0，右击选择"Connect Target"
出现以下错误：
Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 6.0.504.1)

想问下这个问题怎么解决，重启板子也没有用。。

czs----Tronlong

Dear ，

1、仿真器固件出货已更新，如果用的是配套的CCS6.1就不用更新
2、查看设备管理器看看仿真器是否正常识别
3、查看仿真器是否处于debug

随风吟

czs----Tronlong 发表于 2018-9-5 21:28
Dear ，

1、仿真器固件出货已更新，如果用的是配套的CCS6.1就不用更新

仿真器能够被正常识别，之前也用过，应该没太大问题。看CCS的配置，也是支持AM4728的，就是连接的时候会报如下错：
Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 6.0.504.1)

看这个好像是让我重启开发板，感觉根本没连上，不知道问题出在哪里。。

czs----Tronlong

您好，

       可以尝试使用仿真器或者核心板与底板进行交叉测试，找出确定是“仿真器”还是“底板”或者“核心板”的问题。
       这个报错硬件问题可能性比较大。